Picture of Scanning Probe Microscope- AFM Dimension Icon
Current status:
AVAILABLE
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1st Responsible:
2nd Responsible:
Group:
10_Nanophotonics Flagship Facility
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The Brtuker Icon Atomic Force Microscope (AFM) incorporates the latest evolution on nanoscale imaging with characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. Possible applications for this AFM are: material mapping, electrical characterisation, nanomanipulation and many others. 

Tool name:
Scanning Probe Microscope- AFM Dimension Icon
Area/room:
04.00. High Accuracy Labs
Manufacturer:
Bruker
Model:
ICON
Booking type:
Optional

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