The Bruker Icon Atomic Force Microscope (AFM) incorporates the latest evolution on nanoscale imaging with characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. Possible applications for this AFM are: material mapping, electrical characterisation, nanomanipulation and many others.